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(parent: 6fe9980) | patch
sd-event: increase test-event timeout to 120s
authorRadoslav Kolev <radoslav.kolev@suse.com>
Tue, 14 May 2024 07:39:29 +0000 (10:39 +0300)
committerDaan De Meyer <daan.j.demeyer@gmail.com>
Tue, 14 May 2024 09:34:22 +0000 (11:34 +0200)
commit381c3b64d0a80ccda2ccb0dda6fe825878a6e150
treebfdac2c2db73af89c827bc1b647e6cd301bc9ca0tree | snapshot
parent6fe998037ad60a13e20f5d75a336c10482463a49commit | diff
sd-event: increase test-event timeout to 120s

The test-event test seems to be taking quite a bit more time than
the other 'simple tests', which usually complete in < 1s. In case
of a slower or loaded machine the default 30s timeout is not enough.
src/libsystemd/meson.build diff | blob | history
https://github.com/systemd/systemd.git